Method and system for sample preparation for exposing a main pole on a recording head

ABSTRACT

A method for sample preparation. The method includes mechanically polishing portions of an insulating layer over a main pole of a recording head embedded within a sample structure. The insulating layer is polished top down in planar layers perpendicular to an air bearing surface adjoining the main pole. The method also includes selectively wet etching the remaining portions of the insulating layer to expose the main pole, wherein the insulating layer surrounds the main pole. Etching is made without damaging the main pole.

TECHNICAL FIELD

The various embodiments of the present invention relate to perpendicularrecording head systems. More specifically, various embodiments of thepresent invention relate to sample preparation for exposing the mainpole of the perpendicular recording head.

BACKGROUND ART

Sample preparation for operation and failure analysis is an importanttool in providing a detailed inspection of the physical characteristicsof a recording head fabricated on a substrate. With the structure ofrecording heads decreasing in size and becoming more complex, electronmicroscopy (e.g., scanning electron microscopy) has emerged as acritical tool for highly site-specific operation and failure analysis.More particularly, an important issue is the measurement of criticalparameters on a main pole of the recording head. However, thedifficulties associated with exposing the main pole of the recordinghead using conventional techniques make measurement of these criticaldimensions inaccurate.

Physical characteristics of the main pole provide critical factors indetermining the overall performance of the recording head. Thesephysical characteristics are directly linked to the properties relatedto electrical and magnetic conductivity of the recording head. The mostcritical factors for the main pole properties include the flare pointand flare angle.

Preparation of the sample structure for use in electron microscopy isnecessary for examining the critical dimensions of the recording head.Conventional sample preparation techniques for the sample structureincluding the recording head include mechanical sectioning (e.g.,mechanical lapping techniques). However, since the main pole target onthe recording heads is at least one order of magnitude smaller than thethickness removed through any mechanical sectioning technique employed,it is very difficult to hit the main pole target. For instance, themechanical lapping of the sample may remove too much of the insulatorsurrounding the main pole thereby damaging the main pole and renderingthe sample useless for examination using electron microscopy. On theother hand, the mechanical lapping of the sample may not remove enoughthe insulator surrounding the main pole. In this case, the main pole hasnot been exposed enough for use in electron microscopy. As a result, thesuccess rate for exposing the main pole sufficiently for use in electronmicroscopy is very low.

Another conventional technique used for sample preparation in electronmicroscopy is to combine the techniques of mechanical sectioning (e.g.,mechanical lapping) with focused ion beam (FIB). For example, many FIBsteps are used in conjunction with mechanical lapping to fine tune theexposure of the main pole of the recording head for examination inelectron microscopy. However, this combined technique is very laborintensive and expensive, both in terms of human and equipment costs whenused for failure analysis. As a result, the expense for samplepreparation through a combined mechanical sectioning and FIB is costprohibitive, especially if more than one sample in a batch of recordingheads is to be examined. Additionally, because of the time and costinvolved, the combined techniques of mechanical sectioning and FIB isnot scalable to examine multiple recording heads in a batch of recordingheads.

Thus, a need exists for a preparation technique that provides bettermain pole exposure for operation and failure analysis.

DISCLOSURE OF THE INVENTION

A method for sample preparation. The method includes mechanicallypolishing portions of an insulating layer over a main pole of arecording head embedded within a sample structure. The insulating layeris polished top down in planar layers perpendicular to an air bearingsurface adjoining the main pole. The method also includes selectivelywet etching the remaining portions of the insulating layer to expose themain pole, wherein the insulating layer surrounds the main pole. Etchingis made without damaging the main pole.

BRIEF DESCRIPTION OF THE DRAWINGS

The above and other objects and advantages of the present invention willbe more readily appreciated from the following detailed description whenread in conjunction with the accompanying drawings not drawn to scale,wherein:

FIG. 1A is a diagram illustrating a perspective view of a samplestructure including a recording head, in accordance with one embodimentof the present invention.

FIG. 1B is a is a diagram illustrating a perspective view of the samplestructure of FIG. 1A after layers of an overcoat has been removedthrough mechanical polishing, in accordance with one embodiment of thepresent invention.

FIG. 2 is a flow diagram illustrating steps in a method for samplepreparation for exposing a main pole of a recording head, in accordancewith one embodiment of the present invention.

FIG. 3 is a top down view of the target area of the sample structure ofFIG. 1A illustrating critical parameters of the main pole of a recordinghead, in accordance with one embodiment of the present invention.

FIG. 4 is a diagram illustrating a perspective view of the tip of themain pole of a recording head, in accordance with one embodiment of thepresent invention.

BEST MODES FOR CARRYING OUT THE INVENTION

Reference will now be made in detail to embodiments of the presentinvention, a method and system for sample preparation for exposing amain pole of a recording head, examples of which are illustrated in theaccompanying drawings. While the invention will be described inconjunction with the preferred embodiments, it will be understood thatthey are not intended to limit the invention to these embodiments. Onthe contrary, the invention is intended to cover alternatives,modifications and equivalents, which may be included within the spiritand scope of the invention as defined by the appended claims.

Furthermore, in the following detailed description of the presentinvention, numerous specific details are set forth in order to provide athorough understanding of the present invention. However, it will berecognized by one of ordinary skill in the art that the presentinvention may be practiced without these specific details. In otherinstances, well known methods, procedures, components, and circuits havenot been described in detail as not to unnecessarily obscure aspects ofthe present invention.

Accordingly, embodiments of the present invention provide a method andsystem for sample preparation for exposing a main pole of a recordinghead. As a result, other embodiments of the present invention serve theabove purpose and provide a preparation technique that provides a highrate of success to expose the main pole or a recording for operation andfailure analysis. Furthermore, other embodiments of the presentinvention serve the above purposes and provide a sample preparationtechnique that is allows for sample preparation in batches with a highrate of success. Still other embodiments of the present invention servethe above purposes and provide for sample preparation technique that iscost effective to employ during operation and failure analysis.

Embodiments of the present invention are described within the context ofrecording heads used for magnetic storage. That is, embodiments of thepresent invention can be used to expose recording heads of any type.However, in particular, embodiments of the present invention aredescribed within the context of perpendicular recording heads used formagnetic storage. Perpendicular recording heads used for perpendicularrecording magnetize the storage medium perpendicularly to the filmplane, rather than in the file plane, as in horizontal recording. Assuch, embodiments of the present invention are described within thecontext of exposing the main pole of a perpendicular recording head suedfor magnetic storage.

FIG. 1A is a diagram illustrating a perspective view of a samplestructure 100 including a main pole of a recording head, in accordancewith one embodiment of the present invention. Sample preparation of thestructure 100 is necessary to expose the deposited end of the recordinghead 110 for examination in electron microscopy (e.g., scanning electronmicroscopy [SEM]). The features in FIG. 1A are not drawn to scale.

While embodiments of the present invention are described within thecontext of perpendicular recording (e.g., write) heads, otherembodiments of the present invention are well suited for exposing anytype of recording head, component, or detail of a semiconductorintegrated circuit.

As shown in FIG. 1A, the deposited end of the recording head 110 isembedded within the sample structure 100. Also shown is a substrate 115upon which the deposited end of the recording head 110 is deposited. Thedeposited end of the recording head 110 is deposited on an upper surfaceof the substrate 115.

An insulating layer surrounds the deposited end of the recording head110. In one embodiment, the insulating layer is comprised of alumina(Al₂O₃). As shown in FIG. 1A, the insulating layer includes aninsulating undercoat 145 and an insulating overcoat 140. The insulatinglayer also includes a middle coat 147 of alumina shown in FIG. 1A withinwhich the deposited end of the recording head 110 is formed As such, thedeposited end of the recording head 110 is shown embedded between theinsulating overcoat 140 and the insulating undercoat 145 within themiddle layer 147. That is, the deposited end of the recording head 110is surrounded by the insulating layer. In one embodiment, the insulatinglayer provides support for the deposited end of the recording head 110in the sample structure 100.

In addition, a carbon overcoat layer 120 is shown in FIG. 1A. The carbonovercoat layer 120 is formed on a side surface of the sample structure100 that includes a side surface of the substrate 115 and a side surfaceof the insulating overcoat and undercoat layers 140 and 145. The mainpole 135 of the deposited end of the recording head is exposed to thecarbon overcoat layer 120 through the insulating overcoat 140, middlecoat 147, and undercoat 145. In particular, the carbon overcoat layer120 provides further protection for the exposed tip of the main pole 135of the deposited end of the recording head 110. That is, the carbonovercoat layer 120 protects the pole tip from corrosion.

In addition, an air bearing surface 130 is shown in FIG. 1A. The airbearing surface 130 is adjacent to the exposed tip of the main pole 135of the deposited end of the recording head 110. The air bearing surface130 interfaces with a storage medium (not shown). For example, the airbearing surface 130 lies flat or parallel to the surface of the storagemedium as data is being recorded or read from the storage medium.

As shown in FIG. 1A, the distance “x” measured from the deposited end ofthe recording head 110 to the top surface of the sample structure 100 isgreater than 5 microns. Arrow 105 points to the top surface of thealumina overcoat 140. In addition, the arrow 105 points in the directionof a top down view of the sample structure 100 and the deposited end ofthe recording head 110.

The sample structure as shown in FIG. 1A is in an unprepared state. Thealumina overcoat 140 in its present state impedes any view of thedeposited end of the recording head 110 using SEM. That is, thedimensions of the insulating layer 140 are too great to allow SEM toexamine the recording head 110.

FIG. 2 is a flow diagram 200 illustrating steps in a method for samplepreparation for exposing a main pole of a perpendicular recording head,in accordance with one embodiment of the present invention. Whileembodiments of the present invention are described within the context ofperpendicular recording heads, other embodiments of the presentinvention are well suited to sample preparation for exposure of any typeof recording head, or component of an semiconductor integrated circuit.One of the advantages of using the method as described in flow diagram200 to expose the main pole is that there is a great increase in thesuccess rate over conventional sample preparation techniques. Since thesubmicron target is not immediately exposed using mechanical sectioning,there is less of a chance to damage the recording head using thetechnique outlined in flow diagram 200.

At 210, the present embodiment optionally removes the carbon overcoatthat covers an air bearing surface. The carbon overcoat is adjacent tothe main pole of a perpendicular recording head. The recording head isembedded within a sample structure. Removal of the carbon overcoat isnot necessary, but does provide improved measurements of the criticalparameters as measured using electron microscopy (e.g., SEM). In oneembodiment, the process used to remove the carbon overcoat includes anash process. In particular, a dry strip process using oxygen plasma isused to strip the carbon overcoat layer. For instance, an oxygen ashprocess is applied for approximately 30 minutes to remove the carbonovercoat layer, in one embodiment.

At 220, the present embodiment mechanically polishes portions of aninsulating layer (e.g., alumina) over a main pole of the recording headthat is embedded within the sample structure. In particular, the presentembodiment removes most of the insulating layer that is present abovethe main pole of the recording head. In one embodiment, the mechanicalpolishing is performed through a mechanical lapping process that grindsthe surface of the sample structure. The sample structure is polishedtop down in planar layers perpendicular to an air bearing surfaceadjoining the main pole

The mechanical polishing is performed to prepare the sample structurefor the etching procedure that follows. More specifically, themechanical polishing is performed to reduce the amount of alumina in theinsulating layer that needs to be etched. Not only does this reduce thetime for etching, but the mechanical polishing leaves the samplestructure in a more uniform state for etching. That is, the surfaces ofthe insulating layer are more uniformly distant from the recording head,which provides for a more even etching of the insulating layer inrelation to the recording head so that the recording head is notprematurely detached from the insulating layer.

In addition, removing most of the insulting layer through mechanicalpolishing also reduces the amount of debris around the target area ofinterest, the tip of the main pole of the recording head. Also, tofurther remove debris, another embodiment includes rinsing the samplestructure after the mechanical polishing to further prepare the samplestructure for the etching procedure that follows.

FIG. 1B is a diagram illustrating a perspective view of the samplestructure 100 of FIG. 1A showing the process of mechanical polishing, inaccordance with one embodiment of the present invention. As shown inFIG. 1B, the recording head 110 is surrounded by the insulating layer,to include the overcoat 140, the middle layer 147, and the undercoat145. Also, the carbon overcoat layer 120 is shown covering the exposedtip of the main pole 135 of the deposited end of the recording head 110.As described before, in FIG. 1B, the carbon overcoat layer 120 has notbeen removed prior to the mechanical polishing. However, otherembodiments of the present invention are well suited to performing aremoval of the carbon overcoat layer 120, in which case, the carbonovercoat layer 120 would not be shown in FIG. 1B. The features in FIG.1B are not drawn to scale.

As shown in FIG. 1B, the sample structure 100 is polished top down inplanar layers perpendicular to the air bearing surface 130 adjoining themain pole 135. As shown in FIG. 1B, the planar layers 141 and 142, forexample, are removed from the top down. The top down direction waspreviously described in relation to arrow 105 of FIG. 1A. Moreparticularly, the planar layers of the insulating layer that are removed(e.g., layers 142 and 141) are parallel to a planar surface of the mainpole upon which critical parameters can be measured.

As shown in FIG. 1B, planar layers 141 and 142 also include portions120A and 120B, respectively, of the carbon overcoat layer 120. That is,if the carbon overcoat layer 120 has not been previously removed, themechanical polishing will also remove portions of the carbon overcoatlayer 120.

After removal of the planar layers, most of the alumina overcoat 140 isremoved. As shown in FIG. 1B, the distance “x prime” measured from thedeposited end of the recording head 110 to the top surface of the samplestructure 100 is less than 5 microns. Embodiments of the presentinvention are able to mechanically polish the insulation overcoat towithin less than one micron; however, the benefit of embodiments of thepresent invention is that by first mechanically polishing the insulatingovercoat the general area surrounding the deposited end of the recordinghead is quickly exposed without damaging the main pole 135 of thedeposited end of the recording head 110.

Returning now to flow diagram 200, at 230, the present embodimentselectively wet etches remaining portions of the insulating layer toexpose the main pole. The insulating layer surrounds and supports thedeposited end of the recording head. For instance, the etch is anisotropic etch that removes the insulating layer from all exposedsurfaces.

Embodiments of the present invention use an etchant for the etchingprocess that is an alkaline etching solution. For example solutions ofsodium carbonate (Na₂CO₃) or sodium borate (Na₂B₄O₇), or any othersimilar solution in varying molar concentrations can be used as anetchant.

The selective wet etch is performed without damaging the main pole. Thatis, the selective wet etch can be performed without physically alteringthe characteristics of the main pole, and without dislodging the mainpole and the deposited end of the recording head from the insulatinglayer. More specifically, the molar composition of the etchant used, thetemperature (e.g., approximately 50 degrees Celsius) of the etchingsolution, and the duration of time for etching can be varied to controlthe rate and an amount of the insulating layer that is etched so thatthe main pole is not damaged.

In another embodiment, the sample structure is rinsed with a wettingagent after the selective etching process. For instance, the wettingagent is water (H₂O), such as de-ionized water. The rinsing is performedto remove the water soluble etch by-products so that the by-productswill not crystallize and impede or block views of the main pole of therecording head.

The process outlined in flow diagram 200 allows for batching varioussample structures of recording heads to be prepared simultaneously. As aresult, the main pole physical parameters are revealed for SEM imagingwithout undergoing a laborious focused ion beam process.

After the process outlined in flow diagram 200 is completed, the mainpole of the deposited end of the recording head is sufficiently exposedfor viewing using an SEM. As such, the present embodiment further mountsthe sample structure for SEM imaging. In another embodiment, the samplestructure can be optionally flashed with a conductive coating (e.g.,gold palladium [AuPd], carbon, chrome, gold [Au], platinum [Pt], etc.)to increase the electrical stability of the sample structure during theSEM imaging to measure critical parameters, such as flare point andflare angle of finished perpendicular recording heads. Flare point andflare angle provide information as to the performance of the recordinghead.

FIG. 3 is a diagram of top down view of a planar surface of the mainpole 300 of the deposited end of the recording head after exposurethrough a two step mechanical polish and etch process. As shown in FIG.3, the main pole parameters can be imaged and measured using SEM. Forinstance, the distance of the flare point from tip of the main pole atthe air bearing surface 310 to the flare point can be measured.

On the right side, the flare point is the intersection of the verticalportion 320 and the angled portion 325 of the main pole 300. On theright side, the distance to the flare point from the air bearing surface310 is indicated by d_(R). On the left side, the flare point is theintersection of the vertical portion 330 and the angled portion 335 ofthe main pole 300. On the left side, the distance to the flare pointfrom the air bearing surface 310 is indicated by d_(L). For example, thedistances to the flare point from the air bearing surface 310 both onthe left and right sides can be of dimensions less than 500 nanometers.

In addition, the flare angle can be measured. On the right side, theflare angle is measured as the angle between the vertical portion 320that is extended and the angled portion 325. That is, the angle θ_(R)indicates the flare angle on the right side of the main pole 300. On theleft side, the flare angle is measured as the angle between the verticalportion 330 that is extended and the angled portion 335. That is, theangle θ_(L) indicates the flare angle on the left side of the main pole300.

FIG. 4 is an angled view of the main pole 300 of the deposited end ofthe recording head after exposure through a two step mechanical polishand etch process. As shown in FIG. 4, the main pole parameters can beimaged and measured using SEM. For instance, the length “L” and width“W” of the pole tip 410 adjacent to the air bearing surface can bemeasured. For example, the length “L” and width “W” can be of dimensionsless than 200 nanometers. Also, as shown in FIG. 4 the distance “d_(R)”between the flare point and air bearing surface, as well as the flareangle “θ_(R)” is provided. After the etching process, the main pole ofthe deposited end of the recording head can be fully exposed. That is,enough of the insulating layer has been etched away to expose thecritical parameters of the main pole of the recording head; however,enough of the insulating layer remains to support and attach the mainpole and the recording head to the substrate. With proper presentationof the sample structure, measurement of the length “L” and width “W” ispossible using SEM imaging.

Accordingly, embodiments of the present invention provide a method andsystem for sample preparation for exposing a main pole of a recordinghead. Embodiments of the present invention are able to routinely measurethe features of interest in a main pole of a recording head. That is,embodiments of the present invention can be performed in a manufacturingenvironment on a routine basis to allow physical confirmation ofmeasurements of critical parameters concerning the main pole of therecording head.

A method and system for sample preparation for exposing a main pole of arecording head is thus described. While the invention has beenillustrated and described by means of specific embodiments, it is to beunderstood that numerous changes and modifications may be made thereinwithout departing from the spirit and scope of the invention as definedin the appended claims and equivalents thereof. Furthermore, while thepresent invention has been described in particular embodiments, itshould be appreciated that the present invention should not be construedas limited by such embodiments, but rather construed according to thebelow claims.

1. A method for sample preparation, comprising: mechanically polishingportions of an insulating layer over a main pole of a recording headembedded within a sample structure, wherein said insulating layer ispolished top down in planar layers; and selectively wet etchingremaining portions of said insulating layer to expose said main polewithout damaging said main pole, wherein said insulating layer surroundssaid main pole.
 2. The method of claim 1, wherein said recording head isa perpendicular recording head.
 3. The method of claim 1, wherein saidmechanically polishing comprises: mechanically lapping said planarlayers.
 4. The method of claim 1, wherein said selectively etchingfurther comprises: etching said insulating layer in an alkaline etchingsolution.
 5. The method of claim 1, wherein said insulating layercomprises alumina (Al₂O₃).
 6. The method of claim 1, wherein saidmechanically lapping comprises: lapping to within 5 microns or smallerof said main pole.
 7. The method of claim 1, further comprising:mounting said sample structure for SEM imaging.
 8. The method of claim1, wherein the planar layers are lapped perpendicular to an air bearingsurface adjoining said main pole
 9. A method for sample preparation,comprising: removing a carbon overcoat adjoining a main pole of aperpendicular recording head embedded within a sample structure;mechanically lapping portions of an alumina (AlO3) insulating layer oversaid main pole, wherein said alumina insulating layer is lapped top downin planar layers perpendicular to an air bearing surface adjoining saidmain pole; and selectively wet etching remaining portions of saidalumina insulating layer to expose said main pole without damaging saidmain pole, wherein said alumina insulating layer surrounds said mainpole.
 10. The method of claim 9, wherein said removing a carbon overcoatcomprises: performing an oxygen ash process to remove said carbonovercoat.
 11. The method of claim 9, wherein said mechanically lappingfurther comprises: preparing said sample structure for said selectivewet etching by rinsing said sample structure after said mechanicallypolishing.
 12. The method of claim 9, wherein said mechanically lappingcomprises: lapping to within 5 microns or smaller of said main pole. 13.The method of claim 9, further comprising: flashing said samplestructure with a conductive coating.
 14. The method of claim 9, whereinsaid conductive coating comprises gold palladium (AuPd).
 15. The methodof claim 9, further comprising: rinsing said sample structure with awetting agent after said selectively etching.
 16. The method of claim 9,wherein said selectively wet etching further comprises: varying time forsaid etching to control an amount of said alumina insulating layer thatis etched.
 17. The method of claim 9, wherein said selectively etchingfurther comprises: varying concentrations of an etchant used for saidselectively etching to control an amount of said alumina insulatinglayer that is etched.
 18. The method of claim 9, wherein saidselectively etching further comprises: varying temperature of a solutioncomprising an etchant used for said selectively etching to control anamount of said alumina insulating layer that is etched.
 19. A system forsample preparation, comprising: means for mechanically lapping portionsof an alumina insulating layer over a main pole of a recording headembedded within a sample structure, wherein said alumina insulatinglayer is lapped top down in planar layers perpendicular to an airbearing surface adjoining said main pole, and wherein said planar layersis parallel to a planar surface of said main pole upon which criticalparameters can be measured; and means for selectively wet etchingremaining portions of said alumina insulating layer using an alkalineetchant to expose said main pole without damaging said main pole,wherein said alumina insulating layer surround said main pole.
 20. Thesystem of claim 19, further comprising: means for removing a carbonovercoat between said air bearing surface and said main pole byperforming an oxygen ash process.
 21. The system of claim 19, whereinsaid means for mechanically lapping comprises: means for lapping towithin 5 microns or smaller of said main pole.
 22. The system of claim19, further comprising: means for flashing said sample structure with aconductive coating comprising gold palladium (AuPd).
 23. The system ofclaim 19, further comprising: means for rinsing said sample structurewith a wetting agent after said selectively etching.
 24. The system ofclaim 19, further comprising: means for mounting said sample structurefor SEM imaging.